JEOL JEM-2200FS

Type: JEM-2200FS

Person in charge: Markus Drechsler

Manufacturer: JEOL GmbH

200kV EFTEM with Schottky FEG and In-Column Omega Energyfilter

Point Resolution:     0.27 nm (Cryo-Stage - CR)
Energy Resolution:     0.8 eV (FWHM of zero-loss peak)
Acc. Voltage:     160, 200 kV
Energy Shift / Step Max:     3,000 volt / 0.2 volt
FEG ZrO/W(100):     Schottky type (4x10^8A/cm^2sr)
Probe Current:     0.5 nA at 1 nm probe
Cs / Cc of OL:     0.5 mm / 1.1 mm
Minimum spot size:     2-5 nm (Cryo-Stage - CR)
Magnification Range:     LMAG: 100-5K, MAG: 5K-1.0M (Cryo-Stage - CR)
Camera Length (SADIFF):     250-2500 mm (Cryo-Stage - CR)
EELS dispersion at 200 kV:     1.2 µm/eV on the slit, 50-300µm /eV on the final image plane
Image detection:     Gatan CMOS (OneView) camera with GMS 3.11

Webmaster: Dr. Markus Drechsler